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Diagram of an Application-Specific Integrated Circuit (ASIC), Test Chip by Xerox Palo Alto Research Center — VisualArtsDB
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Diagram of an Application-Specific Integrated Circuit (ASIC), Test Chip
Xerox Palo Alto Research Center
1986
Medium
Computer-generated plot on paper
Dimensions
92 1/2 x 42 1/2" (235 x 108 cm)
Genre
Design
Museum
Museum of Modern Art (MoMA), New York City, NY, US